扫描狭缝光束分析仪

规格

Detail

波长

Si detector: 190 to 1150 nm

InGaAs detector: 650 to 1800 nm

Si + InGaAs detectors: 190 to 1800 nm

Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm

扫描光束直径

Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*

InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*

InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*

平面间距(CM4 models)

5 mm: -5, 0, +5, +20 mm

平面间距(CM3 models)

10 mm: -10, 0, +10, 0 mm

Beam Waist Diameter Measurement

Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat

1/e² (13.5%) width

User selectable % of peak

Knife-Edge mode* for very small beams

Beam Waist Position Measurement

± 20 µm best in X, Y, and Z — contact DataRay for recommendation

Measured Sources

CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

Resolution Accuracy

0.1 µm or 0.05% of scan range

± < 2% ± = 0.5 µm

M² Measurement

1 to > 20, ± 5%

Divergence/Collimation, Pointing

1 mrad best — contact DataRay for recommendation

Maximum Power & Irradiance

1 W Total & 0.5 mW/µm²

Gain Range

1,000:1 Switched 4,096:1 ADC range

Displayed Graphics

X-Y-Z Position & Profiles, Zoom x1 to x16

Update Rate

~5 Hz

Pass/Fail Display

On-screen selectable Pass/Fail colors. Ideal for QA & Production.

Averaging

User selectable running average (1 to 8 samples)

Statistics

Min., Max., Mean, Standard Deviation

Log data over extended periods

XY Profile & Centroid

Beam Wander display and logging

Minimum PC Requirements

Windows, 2 GB RAM, USB 2.0/3.0 port