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BeamMap2-CM Collimate

BeamMap2-CM Collimate

BeamMap2-CM Collimate

BeamMap2-CM Collimate – XYZΘΦ Scanning Slit

 

 

Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm

 

Port-powered USB 2.0

 

Features

  • 190 to 1150 nm, Silicon detector
  • 650 to 1800 nm, InGaAs detector
  • 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
  • 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
  • 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
  • Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
  • Port-powered USB 2.0; flexible 3 m cable; no power brick
  • 0.1 µm sampling and resolution
  • Linear & log X-Y profiles, centroid
  • Profile zoom & slit width compensation
  • Real-time multiple Z plane scanning slit system
  • Real-time XYZ profiles, Focus position
  • Real-time M², Divergence, Collimation, Alignment

Applications

  • Laser printing & marking
  • Medical lasers
  • Diode laser systems
  • Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
  • Development, production, field service
  • CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
  • M² measurement with available M2DU stage

* model-dependent

 model-dependent

 

Specification

Specification

Detail

Wavelength

Si detector: 190 to 1150 nm

InGaAs detector: 650 to 1800 nm

Si + InGaAs detectors: 190 to 1800 nm

Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm

Scanned Beam Diameters

Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*

InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*

InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*

Plane Spacing (CM4 models)

5 mm: -5, 0, +5, +20 mm

Plane Spacing (CM3 models)

10 mm: -10, 0, +10, 0 mm

Beam Waist Diameter Measurement

Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat

1/e² (13.5%) width

User selectable % of peak

Knife-Edge mode* for very small beams

Beam Waist Position Measurement

± 20 µm best in X, Y, and Z — contact DataRay for recommendation

Measured Sources

CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

Resolution Accuracy

0.1 µm or 0.05% of scan range

± < 2% ± = 0.5 µm

M² Measurement

1 to > 20, ± 5%

Divergence/Collimation, Pointing

1 mrad best — contact DataRay for recommendation

Maximum Power & Irradiance

1 W Total & 0.5 mW/µm²

Gain Range

1,000:1 Switched 4,096:1 ADC range

Displayed Graphics

X-Y-Z Position & Profiles, Zoom x1 to x16

Update Rate

~5 Hz

Pass/Fail Display

On-screen selectable Pass/Fail colors. Ideal for QA & Production.

Averaging

User selectable running average (1 to 8 samples)

Statistics

Min., Max., Mean, Standard Deviation

Log data over extended periods

XY Profile & Centroid

Beam Wander display and logging

Minimum PC Requirements

Windows, 2 GB RAM, USB 2.0/3.0 port

* Knife-Edge mode requires CM3 model

Product specifications are subject to change without notice

 model-dependent

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