Laser diode beam source 51nanoFI
Schäfter + Kirchhoff
Schäfter + Kirchhoff
Schäfter + Kirchhoff
Performance Features:
Applications:
1. Back-Reflection Particle Measurement
2. Fabry Perot Interferometry
3. Laser Deflection Measurement
Technical Data
curr. No. | Type | Wavelength [nm] | Pout [mW] | Laser diode code | Supply power [V] | MFD 1⁄e² [µm] |
---|---|---|---|---|---|---|
1 | 51nanoFI | 405 | 18 | M29 | 12 | 2.9 |
2 | 51nanoFI | 514 | 4.5 | X09 | 12 | 3.6 |
3 | 51nanoFI | 637 | 2.3 | H10 | 5/12 | 4.5 |
4 | 51nanoFI | 640 | 10.8 | H22 | 5/12 | 4.5 |
5 | 51nanoFI | 660 | 5.4 | M01 | 5/12 | 4.7 |
6 | 51nanoFI | 660 | 22.5 | B15 | 5/12 | 4.7 |
7 | 51nanoFI | 685 | 8 | H13 | 5/12 | 4.8 |
8 | 51nanoFI | 780 | 8 | H06 | 5/12 | 5.6 |
9 | 51nanoFI | 830 | 7.2 | H19 | 5/12 | 5.9 |
10 | 51nanoFI | 1060 | 10 | Q05 | 5/12 | 7.5 |
11 | 51nanoFI | 1080 | 20 | EY10 | 5/12 | 7.6 |
12 | 51nanoFI | 1310 | 2 | M14 | 5/12 | 9.2 |
13 | 51nanoFI | 1550 | 3 | M28 | 5/12 | 10.9 |