Four-point Probes

QuadMapSystem Features: Designed for the production environment, the QuadMap provides high speedmeasurements of thin films and wafers or solar tiles. A test sample may be loaded and tested with 49 points in less than a minute. A touch screen interface allows users to easily set test parameters. A pin lift chuck allows easy placement of the sample on the chuck with a vacuumwand or tweezers. An option for an automatic cassette loader creates a fully automatic system. The system is standalone with a small footprint. Models are available in 150mm, 156mm square, 200mm and 300mmconfigurations.