GTL5050 Probing system

GTL5050 Probing system

If you’re relying on vertical side-to-side probing for two-sided structures, you haven’t seen anything yet.

Until now, if you’ve had the need to measure signal paths from opposite sides of a test board,you haven’t had a lot of options. Now you do.

GTL 5050 System is designed for simultaneous probing on opposite sides of a PCB. It allows you to measure transmission paths between line-cards when mounted directly to the backplane.

MEASURING SUCCESS ON A RANGE OF STRUCTURES

In order to achieve successful SI measurements, you need the ability to probe test structures of multiple sizes, from packages to emulation boards. On many test structures,such as BGA packages and emulation boards, in which the signal path traverses from one side of the board

to the other, you must have the ability to probe sides simultaneously.You also need the ability to test linecard to line-card when they’re attached to the main backplane. And you need the ability to place the probes and control their travel, precisely.

THE GTL 5050 SYSTEM:THE RESULT OF 20 YEARS OF TESTING

The GTL 5050 System was designed from the ground up by SI professionals with decades of experience working to solve complex test and measurement challenges, like yours.

The GTL 5050 is the first system that lets you probe a wide variety of threedimensionaland two-sided structures.

You can now simultaneously probe multiple-board interconnects, BGA packages, test sockets, contactors,PCB test boards, via arrays, emulation boards, and backplanes. The GTL 5050 gives you unprecedented control and visual access to your structure, thus improving accuracy

in the testing process. Unlike other lab bench SI probing solutions, the GTL 5050 uses a rotating platform that is mounted on a rigid steel pedestal base. The test structure is securely fixed on the rotating platform, allowing you to perform probing on each side of the board, with amplroom for multiple positioners.

Probe placement on the board bottom-side is accomplished with Gigatest Labs’ unique joystick-controlled remote positioners and integrated CCD optics.These innovations enable precise placement of the probes on the bottom side test vias.

A REVOLUTIONARY PLATFORM

The GTL 5050 System dramatically improves your ability to accurately probe test structures, particularly those requiring top-bottom or multi-level access.

COMPLETE VISIBILITY AND CONTROL

The GTL 5050 System’s unique joystick controlled remote positioners enable a new level of precision in the placement and control of probes. Its innovative micro-CCD camera option provides access to hard-to-view places,with visual access and probe placement in limited space, which is a particular challenge with line-card to line-card measurements. The system also features free-motion arm-mounted stereozoom optics to make it easy to view top-side test sites and vias, as well as probes.

THE FLEXIBILITY TO ACCOMMODATE YOUR UNIQUE PROJECT

The GTL 5050 system can accommodate a wide range of test structures.Its sliding platens, which incorporateprecision linear motion bearings, offereasy adjustment to accommodate testsamples ranging from small packagesup to large emulation boards. Toensure rigidity and stability during theprobing process, the platens locksecurely. The system can accommodate

eight or more positioners for complex aggressor/victim measurements.

HOW IS THE GTL 5050 SYSTEM DIFFERENT?

l  The GTL 5050 is the first system of its type with a large rotating platform that lets you probe two sides simultaneously and get accurate top-to-bottom measurements.

l  With a two-line-card-backplane configuration, the GTL 5050 system can test the full signal path in one measurement.

l  Its remote positioners include CCD/optics for precise viewing and probe placement on the bottom side

l  The model GTL 5050 can accommodate a wide range of test structures,from extremely small BGA sockets up to test boards as large as 30"*20" in size